Brightfield microscopy

    Brightfield microscopy is based on image formation by the light beam. Especially effectively its methods are used to control the structure of the specimens with incorporated shadow-producing elements or elements that have a refractive index significantly different from the surroundings.

   Reflected brightfield observation is used for the study of opaque reflective specimens (painted thin sections of metals or ores, biological tissues). Especially effectively this method can be used for the control of semiconductor wafers and photomasks in the design and manufacture of various products of functional electronics, since they contain elements that have a refractive index significantly different from the surroundings.

    The specimen is illuminated strictly from above through the objective, which simultaneously functions as a condenser. The image is created due to the fact that different parts of the specimen have different reflection power and the reflected rays have different intensities.


∙   MICRO 200 (T) - 01


∙   MI - 1 (T) 

∙   MI - 2 (T)


    Transmitted brightfield observation is one of the most widely applicable methods of observation in optical microscopy. It is ideal for the study of transparent specimens, consisting of elements with different optical density (thin stained sections of plant and animal tissue, thin sections of minerals, etc.). Especially effectively this method can be used to detect defects in photomasks – the resulting image appears highly-contrast due to the difference in the densities of the elements of the structure and glass substrates of photomasks.

    The light beam emitted by the microscope illuminator passes through the specimen and the objective and produces a uniformly illuminated field near the focal plane of the eyepiece.

    The elements of the specimen structure partially absorb and partially scatter the incident light. As a result, a dark image appears on a light background.

    This method can also be used for observation of non-absorptive specimens, but only if they scatter the illuminating beam so strongly that a large part of it fails to strike the objective.


∙   MICRO 200 (T) - 01


∙   MI - 1 (T) 

∙   MI - 2 (T)