MA 300 Automated Station
The MA300 Automated Station based on the microscope working in the UV spectrum (365 nm) is designed for inspection of the elements of IC patterns on semiconductor wafers with the dimensions from 0.18 µm and more.
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MA300 AUTOMATED STATION Find out more»
The MA300 Automated Station based on the microscope working in the UV spectrum (365 nm) is designed for inspection of the elements of IC patterns on semiconductor wafers with the dimensions from 0.18 µm and more.
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MA300 AUTOMATED STATION Find out more»