MICRO 200(T)-01 microscope

   The MICRO 200-01 and MICRO 200T-01 microscopes are designed for inspection of semiconductor wafers and photomasks in production of various electronic components as well as for research in other fields of science and technology.

    Microscope observation modes:

        ∙reflected brightfield and darkfield observation (MICRO 200-01);

                     ∙transmitted brightfield observation, reflected brightfield and darkfield observation (MICRO 200T-01);

                     ∙reflected polarization contrast* and differential interference contrast* observation.